Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities
Investment sharpens process control from materials development through manufacturing
Qnity Electronics, Inc. (“Qnity”) (NYSE: Q), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan® SP7XP unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity's ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps.
This press release features multimedia. View the full release here: https://www.businesswire.com/news/home/20260819307953/en/ James Seale (left), general manager at KLA, joins Qnity's Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing & Technology Center in Marlborough, Mass., following the installation of a Surfscan® SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity's ongoing investment in advanced semiconductor materials innovation.
